【Patent Type】 Invention Patent 【Patent Name】 Mask overlay method for screen printing device, screen printing device
[Applicant] Yamaha Motor Co., Ltd. [Inventor] Miyake Shigu [Address of the main applicant] Shizuoka Prefecture, Japan [Application No.] 200480012616
【 Application Date 】 2004.04.23
【Accredited Announcement No.】 1784307
【 Validation announcement date 】 2006.06.07
[Main classification number] B41F15/26(2006.01)I
[Classification] B41F15/26(2006.01)I
【 Priority Items】 2003.5.9 JP 131678/2003
Sovereign Items 1. A mask overlay method of a screen printing apparatus, including a mask having an opening for printing, a holding unit for holding a substrate as a printed object, and a mask holding the unit relative to the mask The moving driving unit overlaps the mask and the substrate of the screen printing apparatus that performs printing by overlapping the substrate held on the holding unit with the mask by the driving unit, wherein the mask is overlapped with the mask. Before the sheet and the substrate, a circuit diagram of the substrate and an opening for printing of the mask corresponding to the circuit diagram are taken, and based on the image data, positional errors of the image of the circuit diagram and the opening of the printing are obtained, and the driving is controlled based on the error. The unit overlaps the mask and the substrate.
[Instruction CD-ROM] D0623-1
【International Application】 2004-04-23 PCT/JP2004/005852
【International Publication】 2004-11-18 WO2004/098887 [Abstract] The screen printing device of the present invention includes a mask (7) having an opening for printing and is held as possible with respect to the movement of the mask (7). The substrate support device (3) of the substrate W of the printed matter is printed on the substrate W and the mask (7) by the operation of the substrate support device (3). The mask overlay method of the screen printing apparatus of the present invention is a circuit diagram of the substrate W and a printing opening of the mask (7) corresponding to the circuit diagram before the mask (7) and the substrate W are overlapped. These image data are used to determine deviations (positional errors) between the circuit pattern and the opening for printing, and the substrate support device (3) is driven and controlled so that the mask and the substrate overlap.
【 Agency 】 Zhongyuan Cinda Intellectual Property Agency Co., Ltd. [Proxy] Lu Hao Tian Junfeng
Source: Beijing Wanfang Data Co., Ltd.
